The functional test of complex integrated circuits

A multilevel automatic generation of test sequences is proposed. The procedure starts by considering the set of functional parameters and the fine structure of the electronic modules composing the circuit. The method may be considered related to automatic software testing or automata identification methods. A functional microprocessor test procedure is described. The method takes into account the synchronous input signals and allows the automatic generation of test programs. A specific high level computer language was developed for that purpose and is described. The 68000 microprocessor was described in that language and its test programs generated. The elements implementing the system are detailed.