A large scale obsidian analysis program at the AAEC Research Establishment uses an automated facility with a multisample capacity and simultaneous PIXE and PIGME measurement. A pinhole filter in front of the PIXE detector ensures that up to 20 element concentrations can be obtained from the samples in a 5 min irradiation. Spectrum analysis and data handling procedures have been set up together with a variety of parametric and non-parametric statistical procedures. The clustering programs have been used with data from a previously measured S.W. Pacific and New Zealand obsidian source collection to identify the origin of artefact material. The example used to illustrate this provenancing program is of obsidian artefacts from the Kermadec and Chatham Islands.