Total dose effects in the 54HC family of microcircuits
Abstract
Motorola and National Semiconductor 54HC00 and 54HC74 microcircuits were evaluated using CO-60 to determine their total dose radiation hardness. The devices were found to be radiation soft failing parametrically between 5 and 10 K rads and functionally between 20 and 40 K rads. The failures were bias dependent, relatively insensitive to dose rate, and only annealed moderately when left unbiased at room temperature.
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1984
- DOI:
- 10.1109/TNS.1984.4333511
- Bibcode:
- 1984ITNS...31.1358R
- Keywords:
-
- Electronic Equipment Tests;
- Integrated Circuits;
- Metal Oxide Semiconductors;
- Microelectronics;
- Radiation Dosage;
- Radiation Effects;
- Circuit Reliability;
- Cmos;
- Failure Analysis;
- Radiation Hardening;
- Spacecraft Electronic Equipment;
- Electronics and Electrical Engineering