Unifying view of transient responses for determining lifetime and surface recombination velocity in silicon diodes and back-surface-field solar cells, with application to experimental short-circuit-current decay
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- May 1984
- Bibcode:
- 1984ITED...31..588J
- Keywords:
-
- Diodes;
- Recombination Reactions;
- Silicon Junctions;
- Solar Cells;
- Transient Response;
- Boundary Value Problems;
- Carrier Lifetime;
- Electric Potential;
- Minority Carriers;
- Rates (Per Time);
- Short Circuit Currents;
- Electronics and Electrical Engineering