Characterization of near-millimeter wave materials by means of non-dispersive fourier transform spectroscopy

We have used non-dispersive Fourier-transformspectroscopic techniques to measure the complex indices of refraction of materials between frequencies of 120 and 550 GHz. Results are presented for crystal quartz, crosslinked polystyrene (Rexolite 1422), glass-loaded polytetrafluoroethylene (Duroid 5880) and a nickel ferrite (Trans-Tech 2-111). These results are compared with other data on these materials in this frequency range. The accuracy of these measurements yields a considerable improvement in the near-millimeter-wave characterization of several of these materials. For materials other than crystal quartz, our results are the first measurements of their properties over the entire frequency range studied.