Testing and characterizations of infrared sensor over the temperature range of 2 Kelvin to 300 Kelvin

Various cryogenic techniques were used to evaluate state of the art electro-optic devices. As research, development, and production demands require more sensitive testing techniques, faster test results, and higher production throughput, the emphasis on supporting cryogenic systems increases. The three traditional methods currently utilized in electro-optic device testing are discussed: (1) liquid contaiment dewars; (2) liquid transfer systems; and (3) closed cycle refrigeration systems. Advantages, disadvantages, and the current state of the art of each of these cryogenic techniques is discussed.