Semiconductor measurement technology: A FORTRAN program for analysis of data from microelectronic test structures
Abstract
A computer program, STAT2, is described which performs the following functions: reads data as a two dimensional array; calculates mean, sample standard deviation, and median; identifies outliers; calculates replacement values for outliers; makes a graytone, numerical and contour data map on a line printer; makes a numerical map on the user's terminal, makes a histogram on a line printer; constructs a data base for examining correlations among various data sets; and searchers the data base for correlation using several selective keys. The emphasis is on program usage, and detailed descriptions of the commands are given. Data input requirements are addressed. Guidance regarding several types of program modifications is provided.
 Publication:

Final Report National Bureau of Standards
 Pub Date:
 July 1983
 Bibcode:
 1983nbs..reptT....M
 Keywords:

 Computer Programs;
 Integrated Circuits;
 Microelectronics;
 Semiconductor Devices;
 Computation;
 Data Bases;
 Data Processing;
 Fortran;
 Electronics and Electrical Engineering