High-speed digital test capability for emerging technology
Abstract
The implementation of a dynamic digital test assembly (DTA) in a flexible virtual-instrument design, to meet the needs of emerging technology, is discussed. The DTA provides a dynamic high-speed digital test capability through a modular pin-group design. Its capabilities include: testing data rates up to 50 MHz, tri-state output driver control, integral analog switching, timing simulation and bi-directional real-time capabilities. The relationship between DTA and automatic test generator system software is considered. The advantages of DTA include: microprocessor testing/bus structure testing and combined analog/digital testing.
- Publication:
-
AUTOTESTCON 1983; Proceedings of the Conference
- Pub Date:
- 1983
- Bibcode:
- 1983ieee.proc..463A
- Keywords:
-
- Automatic Test Equipment;
- Computer Systems Design;
- Digital Systems;
- Electronic Equipment Tests;
- Testing Time;
- Circuit Reliability;
- Component Reliability;
- Computer Programs;
- High Speed;
- Microprocessors;
- Real Time Operation;
- Very Large Scale Integration;
- Vhsic (Circuits);
- Electronics and Electrical Engineering