How advances in test technology can shape future military electronics maintenance strategy
Abstract
A discussion is conducted on advanced technology development factors that will influence military electronics test strategies, with attention to the way in which such anticipated technologies as those of smart systems, artificial intelligence, automatic information exchange, VHSICs, and high capacity computer memories can lead to a new evolutionary cycle for test strategies. Emphasis is given to the problems posed by intermittent electronic equipment failures, which point to a requirement for continuous monitoring of critical functions.
- Publication:
-
AUTOTESTCON 1983; Proceedings of the Conference
- Pub Date:
- 1983
- Bibcode:
- 1983ieee.proc..203R
- Keywords:
-
- Automatic Test Equipment;
- Electronic Equipment Tests;
- Maintenance;
- Military Technology;
- Technological Forecasting;
- Testing Time;
- Artificial Intelligence;
- Circuit Reliability;
- Computer Storage Devices;
- Information Systems;
- Life Cycle Costs;
- Robotics;
- Electronics and Electrical Engineering