Stopping power of rare gases in amorphous silicon for MeV helium ions

The stopping cross sections of argon, krypton and xenon inside amorphous silicon for alpha particle, in which the concentrations of argon, krypton and xenon were 8,7, and 4 at %, respectively, were measured by the Rutherford backscattering method in the incident energy range from 1.0 to 2.6 MeV for argon and 1.0 to 1.6 MeV for krypton and xenon. If the stopping cross section of silicon given by Ziegler is used and Bragg's rule is assumed, the obtained values of each rare gas were about 30% lower than those for gaseous state given by Ziegler in the energy region near to 1 MeV.