Proceedings of the Seventh International Conference on High Voltage Electron Microscopy
Abstract
Advances in high voltage electron microscopy were examined. Topics include resolution, techniques and instrumentation, radiation effects, in-situ and phase transformations, minerals and ceramics, and semiconductors and thin films. Twenty three papers were abstracted separately for the data base.
- Publication:
-
Conf. held in Berkeley
- Pub Date:
- 1983
- Bibcode:
- 1983beca.conf...16F
- Keywords:
-
- Conferences;
- Electron Microscopy;
- Phase Transformations;
- Resolution;
- Ceramics;
- Minerals;
- Radiation Effects;
- Semiconductors (Materials);
- Thin Films;
- Instrumentation and Photography