INTAC: Digital and analog circuit test stations
Abstract
Test stations used in the INTAC automatic test system for digital and analog circuits are presented. Real time test is achieved by controlling the clock of unit under test. Analog signal is handled by test stations by means of digital techniques.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- May 1983
- Bibcode:
- 1983STIN...8420803.
- Keywords:
-
- Analog Circuits;
- Circuit Reliability;
- Digital Systems;
- Analog To Digital Converters;
- Clocks;
- Microprocessors;
- Real Time Operation;
- Instrumentation and Photography