EMC (electromagnetic compatibility) modeling and analysis: A probabilistic approach
Abstract
This report provides a new and fundamental basis for EMC analysis, i.e., a probabilistic approach. The advances in high speed, high density integrated circuit (IC) technology provides the impetus for investigating new concepts in electromagnetic compatibility/electromagnetic interference (EMC/EMI). Performance criteria, acceptable performance, EMI performance curve and performance threshold are concepts related to susceptibility level in a probabilistic manner. In addition, the interaction at different levels (e.g., system, subsystem, equipment, component) are also discussed. Because large portions of systems are being replaced by complex ICs and because the electromagnetic environment and equipment susceptibility are in reality, random in nature, a probabilistic approach enables one to develop a statistical macromodel. In such an approach, detailed circuit models and functions are replaced by statistical models where probability density functions are used to evaluate probabilities and statistical averages associated with various responses at various operational levels.
 Publication:

NASA STI/Recon Technical Report N
 Pub Date:
 April 1983
 Bibcode:
 1983STIN...8418505E
 Keywords:

 Electromagnetic Compatibility;
 Probability Theory;
 Radio Frequency Interference;
 Graphs (Charts);
 High Speed;
 Integrated Circuits;
 Mathematical Models;
 Probability Density Functions;
 Vulnerability;
 Communications and Radar