Internal noise of low-frequency preamplifiers
Abstract
Experimental measurements of low frequency preamplifiers show that a type LM394 bipolar input stage has less internal input noise than the popular PAR-113 commercial amplifier for source resistances under 1000 ohms. A type 2N6483 JFET design shows similar input noise to the PAR-113. The input current noise of the JFET design is insignificant compared with the Nyquist noise of the source resistance.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- August 1983
- Bibcode:
- 1983STIN...8411398S
- Keywords:
-
- Bipolar Transistors;
- Bipolarity;
- Input;
- Low Frequencies;
- Noise Measurement;
- Preamplifiers;
- Electric Potential;
- Frequency Response;
- Noise Reduction;
- Electronics and Electrical Engineering