Calculation of Misfit Dislocations and Dangling Bond Densities in Abrupt Hg1-xCdxTe Heterojunctions
Abstract
Based on the classical theory of epitaxial crystal growth, the misfit dislocations and dangling bond densities of abrupt (111) Hg l- xCdxTe heterojunctions have been calculated. It is assumed that the misfit between layers with compositions xi and x2 is accommodated by edge dislocations lying along the <111> directions. This is in agreement with recent experiments on the growth of Hgl-xCdxTe epitaxial layers. For the case where (x2 -x1) >0.1 the dangling bond density is on the order of 1011cm-2. Such large dangling bond densities may produce high interface recombination velocities or band-bending at the interface.
- Publication:
-
Society of Photo-Optical Instrumentation Engineers (SPIE) Conference Series
- Pub Date:
- November 1983
- DOI:
- 10.1117/12.935733
- Bibcode:
- 1983SPIE..409...32S
- Keywords:
-
- Crystal Dislocations;
- Heterojunction Devices;
- Liquid Phase Epitaxy;
- Mercury Cadmium Tellurides;
- Solid-Solid Interfaces;
- Density (Number/Volume);
- Infrared Detectors;
- Semiconducting Films;
- Thin Films;
- Solid-State Physics