Investigation of anisotropic films by a resonance method
The dielectric properties of thin-film materials are investigated in the short-wave part of the millimeter band by a high-Q open resonator. The permittivity and degree of artificial anisotropy of a number of dielectric films at a frequency of 75 GHz were determined. The confidence limits of the measured quantities were assessed.
- Pub Date:
- Anisotropic Media;
- Thin Films;
- Microwave Oscillators;
- Millimeter Waves;
- Electronics and Electrical Engineering