The reliability of optoelectronic semiconductor devices
Abstract
Aspects of the calculation, experimental determination, and use of the reliability parameters of sign-synthesizing indicators, optopairs, optoelectronic microcircuits, and elements of fiber-optic communications lines are discussed. Descriptions are given of overloading techniques and methods for nondestructive inspection and failure analysis. The effect of operating conditions on the parameters is assessed, and methods for ensuring reliability during the manufacture of optoelectronic devices are discussed.
- Publication:
-
Moscow Izdatel Radio Sviaz
- Pub Date:
- 1983
- Bibcode:
- 1983MIzRS....R....V
- Keywords:
-
- Electro-Optics;
- Electronic Equipment Tests;
- Photonics;
- Reliability Analysis;
- Semiconductor Devices;
- Accelerated Life Tests;
- Communication Networks;
- Component Reliability;
- Degradation;
- Failure Modes;
- Fiber Optics;
- Microelectronics;
- Optical Communication;
- Optoelectronic Devices;
- Quality Control;
- Service Life;
- Electronics and Electrical Engineering