Noise in time-discrete analog filters

The most important noise sources in time-discrete analog filters which can be monolithically integrated as CCD and switched-capacitor structures are described. In CCD filters, these sources are thermal kTC noise of the input and output levels and unloading processes at the surface attraction sites. Attainable signal-to-noise ratios and optimization possibilities are stated. For SC filters, the most important noise sources are kTC noise and l/f noise. On-chip clock jitter noise can be suppressed by differential processing. The present measurements on integrated MOS switching transistors with small areas confirm the thermal kTC noise limit and show that there is no additional l/f contribution to the noise from the switches. For the integrator, good agreement is obtained between theory and experiment when an operational amplifier with finite unity-gain frequency is included.