Design of new structural high breakdown voltage V-MOSFET Static Shield V-MOSFET
Abstract
Electric field crowding at the bottom of the V-groove render high breakdown voltage V-MOSFETs difficult to obtain. A novel V-MOSFET structure is proposed for which a reverse blocking voltage design method and an on-resistance model have been developed. A device fabricated along the new lines has a breakdown voltage 1.7 times greater than conventional devices. The performance prediction formula proposed indicates a 10 percent increase in on-resistance for the novel V-MOSFET type over the conventional.
- Publication:
-
Electronics Communications of Japan
- Pub Date:
- June 1983
- Bibcode:
- 1983JElCo..66...95K
- Keywords:
-
- Component Reliability;
- Electrostatic Shielding;
- Field Effect Transistors;
- High Voltages;
- Metal Oxide Semiconductors;
- V Grooves;
- Electric Field Strength;
- Electrical Resistance;
- Equipotentials;
- Reliability Engineering;
- Volt-Ampere Characteristics;
- Electronics and Electrical Engineering