CXR testing of box IEMP effects due to charge transfer

It is shown that the continuous X-ray (CXR) test and analysis technique is applicable to the characterization of direct drive systems-generated-electromagnetic-pulse (SGEMP) effects within a plated wire memory (PWM). The high signal-to-noise ratio associated with the continuous model exposure and the well-characterized X-ray source permit an accurate calibration of SGEMP response models over a wide range of parameters. SGEMP response models for a PWM are calibrated using the CXR test and analysis method, making it possible to predict with high confidence the response to arbitrary environments. The test results establish that a CXR test of objects as complex as a PWM is feasible.