Transient and total dose radiation properties of the CMOS/SOS EPIC chip set
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1983
- DOI:
- 10.1109/TNS.1983.4333118
- Bibcode:
- 1983ITNS...30.4256B
- Keywords:
-
- Chips (Electronics);
- Cmos;
- Integrated Circuits;
- Radiation Dosage;
- Radiation Hardening;
- Sos (Semiconductors);
- Computer Storage Devices;
- Gates (Circuits);
- Performance Tests;
- Transient Response;
- Electronics and Electrical Engineering