A Ka-band GaAs monolithic phase shifter
Abstract
The design and performance of a GaAs monolithic 180-degree one-bit switched line phase shifter test circuit for Ka-band operation is presented. A self-aligned gate (SAG) fabrication technique is also described that reduces resistive parasitics in the switching FET's. Over the 27.5-30 GHz band, typical measured differential insertion phase is within 10-20 deg of the ideal time delay characteristic. Over the same band, the insertion loss for the SAG phase shifter is about 2.5-3 dB per bit. The SAG fabrication technique holds promise in reducing phase shifter insertion loss to about 1.5 dB/bit for 30-GHz operation.
- Publication:
-
IEEE Transactions on Microwave Theory Techniques
- Pub Date:
- December 1983
- DOI:
- 10.1109/TMTT.1983.1131665
- Bibcode:
- 1983ITMTT..31.1077S
- Keywords:
-
- Field Effect Transistors;
- Gallium Arsenides;
- Integrated Circuits;
- Microwave Circuits;
- Millimeter Waves;
- Phase Shift Circuits;
- Chips (Electronics);
- Extremely High Frequencies;
- Insertion Loss;
- Microstrip Transmission Lines;
- Microwave Switching;
- Electronics and Electrical Engineering