An automatic test set for the dynamic characterization of A/D converters
Abstract
An automatic test set is described for measuring the dynamic characteristics of A/D converters having up to 16 bits of resolution. The test converter is exercised with stepped input changes typical of the conditions of actual use. All dynamic test parameters are under program control, making it possible to separate and measure dynamic errors of various sources. Typical test results are included.
- Publication:
-
IEEE Transactions on Instrumentation Measurement
- Pub Date:
- March 1983
- DOI:
- Bibcode:
- 1983ITIM...32..180S
- Keywords:
-
- Analog To Digital Converters;
- Automatic Test Equipment;
- Dynamic Tests;
- Electrical Measurement;
- Electronic Equipment Tests;
- Binary Codes;
- Bit Error Rate;
- Delay Circuits;
- Digital Integrators;
- Feedback Control;
- Field Effect Transistors;
- Instrument Errors;
- Logic Circuits;
- Network Synthesis;
- Resistors;
- Switching Circuits;
- Time Constant;
- Time Division Multiplexing;
- Electronics and Electrical Engineering