Probe correction in near field measurements by pseudo sampling technique

The present investigation is concerned with an application of a technique which has been proposed by D'Elia et al. (1983) for the conduction of near-field measurements. The technique, which is based on a pseudosampling representation of the field, makes it possible to obtain a reduction in the number of the required measurements and in the computer time needed. In order to show the feasibility of utilization of the proposed method, a two-dimensional case is considered. The method can be employed to compute the probe position error.