Problems encountered during automated testing of microelectronic devices
Abstract
Several problems in the implementation of electrical tests for medium and large scale microcircuits (memory devices, microprocessors, peripherals) are discussed. Attention is given to the implementation of functional patterns measuring timing parameters such as access time on memory devices. As memory size increases, N2 type patterns become increasingly time consuming. Text fixturing is found to present problems which are extremely difficult to isolate because the fixture itself is usually the least most source of a problem. Proper thermal soak time can be a major factor influencing test times and test accuracy. A problem exists in knowing exactly when the device has reached the desired test temperature. Often device soak time and temp are overestimated to be safe, and productive test time is wasted. Several recommendations are made concerning ways to improve automated testing procedures.
- Publication:
-
IN: ISTFA 1982 - International Symposium for Testing and Failure Analysis; Proceedings of the Symposium
- Pub Date:
- 1982
- Bibcode:
- 1982tfam.proc..140H
- Keywords:
-
- Automatic Test Equipment;
- Electronic Equipment Tests;
- Microelectronics;
- Operational Problems;
- Testing Time;
- Circuit Boards;
- Cmos;
- Computer Storage Devices;
- Error Analysis;
- Microprocessors;
- Peripheral Equipment (Computers);
- Reliability Analysis;
- Electronics and Electrical Engineering