Semiconductor measurement technology: Graphical solution for the helium leak detector and radioisotope methods of hermetic test, master graphs and instructions
Abstract
A graphical procedure for solution of the molecular flow approximation for the back pressurization method of hermetic test makes use of a set of characteristic curves and a test line. The characteristic curves are appropriate for both the helium leak detector and the radioisotope methods of test, although the form of the test line differs between the two methods. Master graphs of the characteristic curves and test lines are now provided in a scale and format appropriate for producing suitable worksheets with a copier. Step by step instructions are given for their use in obtaining solutions for various examples relative to the test specifications in acceptance standards such as MIL-STD 883B, etc.
- Publication:
-
Final Report National Bureau of Standards
- Pub Date:
- November 1982
- Bibcode:
- 1982nbs..reptS....R
- Keywords:
-
- Electronic Packaging;
- Helium;
- Hermetic Seals;
- Leakage;
- Molecular Flow;
- Pressurizing;
- Semiconductor Devices;
- Graphs (Charts);
- Isotopic Labeling;
- Krypton 85;
- Mathematical Models;
- Radioactive Isotopes;
- Instrumentation and Photography