Automatic test methods for linear microcircuits
Abstract
The objective of this effort was to review MIL-M-38510 operational amplifier and comparator electrical test conditions, and to develop simplified test procedures of these parts on general purpose automatic test equipment. There was an emphasis on gain measurements. However, all parameters were investigated for implementation on ATE as well as the effects of accuracy, repeatability, and chip heating. Modifications to MIL-M-38510 slash sheets are recommended, as well as additions to same.
- Publication:
-
Final Technical Report
- Pub Date:
- May 1982
- Bibcode:
- 1982mma..rept.....B
- Keywords:
-
- Automatic Test Equipment;
- Linear Integrated Circuits;
- Microelectronics;
- Accuracy;
- Chips (Electronics);
- Comparator Circuits;
- Heating;
- Electronics and Electrical Engineering