Electrical characterization of 64K dynamic rams
Abstract
Electrical characterizations were performed on 64K dynamic RAMs available from the merchant semiconductor industry. Based on the data obtained, parameter limits were established and proposed for the draft MIL-M-38510/244 specification. The data, proposed limits, and related discussion are presented. The objective of this program was to electrically characterize a representative sample of 64K Dynamic RAMs to establish their performance in a military environment. Based on this characterization, performance limits were to be established and incorporated into a draft MIL-M-38510 detail specification. IBM's approach to this task was extremely comprehensive, and because of their close working relationship with merchant vendors, they were able to select and characterize those devices which have the highest probability of becoming military qualified products. As this report indicates, their characterization was very thorough, and the draft specification (M38510/244) which resulted was comprehensive, of a high quality and was ready for coordination.
- Publication:
-
Final Technical Report
- Pub Date:
- January 1982
- Bibcode:
- 1982ibm..rept.....M
- Keywords:
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- Electrical Properties;
- Random Access Memory;
- Graphs (Charts);
- Metal Oxide Semiconductors;
- Technology Assessment;
- Electronics and Electrical Engineering