RF characterization of semiconductors
Abstract
A capability to perform RF characterization and a program for providing RF performance assurance for semiconductor devices were developed to support advanced weapon systems with all solid state radars. The activities performed and the conclusions formulated on the characterization of various categories of bipolar microwave devices are summarized.
- Publication:
-
Final Report Bendix Corp
- Pub Date:
- June 1982
- Bibcode:
- 1982bend.rept.....T
- Keywords:
-
- Diodes;
- Microwave Equipment;
- Radar Equipment;
- Radio Frequencies;
- Transistors;
- Weapon Systems;
- Capacitance;
- Electromagnetic Noise;
- Semiconductor Junctions;
- Communications and Radar