Lifetime prediction for electronic components and circuits using the phase noise measuring method

A method of lifetime prediction for electronic components and circuits using the temporal evolution of the phase noise level (PNL) as quality criterion is presented. The PNL is shown to be a direct measure for the advance of deficiency processes. A measuring device to determine PNL, and a mathematical method to evaluate the measured data are described. Measurements between 180 and 200 C show that PNL increases exponentially with time and that its temperature dependence obeys the Arrhenius law. The PNL also shows an exponential temporal evolution if NaCl is put on chip surfaces in order to change the activation energy for several deficiency processes.