Electron erosion: A proposed failure mechanism for high-voltage capacitors

Continued research effort on the perfluorocarbon high energy density capacitor technology was directed toward a better understanding of the failure mechanism or mechanisms inherent in this technology. A number of varied experiments were conducted to advance this understanding. The results of this experimental effort suggest that a single failure influence is involved. It is hypothesized that this influence is erosion of the dielectric material by electrons stripped off the electrode material and accelerated across the gap between electrodes and dielectric by the fields present. For example, it was observed that the thickness of the liquid layer between electrodes and dielectric, as controlled by winding tightness, has a dramatic effect on discharge life. A thick layer of liquid results in a large increase in discharge life.