A guide to reliability aspects of microprocessor-based instrument development
Abstract
Techniques for assessing the hardware reliability of microprocessor-based products are reviewed. Models for predicting the failure rates of indifferent categories of microelectronic components, failure mechanisms, and degradation processes are examined. The failure rates of several types of microprocessor, memory and peripheral component, obtained from accelerated life testing are given. Software design philosophies, the choice of programming languages and methods of software testing and reliability assessment are discussed. The life characteristics of microelectronic components follow the same curve as those for discrete digital or analog components, and similar models can be used to describe their failure characteristics. Best estimates of system reliability come from the independent assessment of hardware and software reliability. The overall reliability of hardware is expected to be better in LSI systems, although initial failure rates can be higher than for discrete components.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- March 1982
- Bibcode:
- 1982STIN...8330987T
- Keywords:
-
- Active Control;
- Measuring Instruments;
- Microprocessors;
- Technology Assessment;
- Technology Utilization;
- Accelerated Life Tests;
- Computer Programs;
- Computer Systems Programs;
- Failure Analysis;
- Hardware;
- Large Scale Integration;
- Product Development;
- Reliability Engineering;
- Instrumentation and Photography