New process for preparing complex-shaped dielectric film similar to Mylar
Abstract
A new thermoforming/heat-treatment process yields complex-shaped dielectric film having electrical and shrinkage properties similar to those of flat Mylar film. This similarity should extend to other physical properties because the new process is directly analogous to the process used to prepare Mylar. Commercially available poly(ethylene terephthalate) film is formed into a cavity at approx. 110 C and then heat treated at approx. 180 C. A laboratory-scale forming apparatus has produced cylindrically shaped films having depth/diameter ratio approx. 1, a tapered wall-section, and variation in wall thickness of 3X. Evaluation of other forming methods suggest that the production rate and thickness uniformity can be improved with existing technology. Thermal shrinkage at 150 C, 1 kHz dielectric constant from -55 to +70 C, leakage current at 1 kV, and breakdown voltage have been measured for both the complex-shaped film and Mylar.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- February 1982
- Bibcode:
- 1982STIN...8322535L
- Keywords:
-
- Dielectric Properties;
- Energy Storage;
- Mylar (Trademark);
- Shrinkage;
- Thin Films;
- Electric Potential;
- Heat Treatment;
- Nuclear Weapons;
- Safety;
- Thickness;
- Electronics and Electrical Engineering