Characterization and testing of synchronizer circuits
Abstract
The errors which occur in random access synchronous systems depend on the anomalous behavior of synchronizer devices owing to the marginal driving signals applied at the input of these. Experimental results are given concerning this phenomenon named metastable state and its origin is explained. The flip-flop synchronizers are characterized by introducing the uncertainty interval parameters. The principle of a measuring system founded on a statistical estimation is described. Some experimental results are given concerning various structure and technology flip-flops.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- September 1982
- Bibcode:
- 1982STIN...8320271M
- Keywords:
-
- Circuit Reliability;
- Flip-Flops;
- Performance Tests;
- Synchronizers;
- Cmos;
- Failure;
- Metastable State;
- Ttl Integrated Circuits;
- Electronics and Electrical Engineering