System for measurement of X-rays using a mercuric iodide detector
Abstract
A semiconductor X-ray spectrometer which can be operated at ambient temperature is described. Semiconductors having a large forbidden band such as mercuric iodide or cadmium telluride are employed. Details of the fabrication, installation, and operation of a mercuric iodide detector are presented. Experimental measurement of the efficiency and resolution of the detector using radiation lines of 30.5 and 59.6 KeV (Am 241) and 43, 68, 94, and 122 KeV (Co 57) is described. For this purpose, a mercuric iodide detector, a pulse height analyzer, and associated electronics were used.
- Publication:
-
NASA STI/Recon Technical Report N
- Pub Date:
- October 1982
- Bibcode:
- 1982STIN...8313421N
- Keywords:
-
- Iodides;
- Mercury Compounds;
- Semiconductors (Materials);
- Spectrometers;
- X Ray Spectroscopy;
- Americium 241;
- Cadmium Tellurides;
- Cobalt Isotopes;
- Energy Gaps (Solid State);
- Forbidden Bands;
- Line Spectra;
- Semiconductor Devices;
- Instrumentation and Photography