Additional noise sources in cross-field microwave devices
Abstract
Analysis is made of the additional noise sources in cross-field electron-beam devices. The spectral density of the low-frequency fluctuations of the electron-beam drift velocity due to random changes in the space charge density is calculated. It is pointed out that these fluctuations are related to settling current noise and secondary electron emission.
- Publication:
-
Radioehlektronika
- Pub Date:
- October 1982
- Bibcode:
- 1982Radel..25...88N
- Keywords:
-
- Crossed Fields;
- Electron Beams;
- Microwave Equipment;
- Noise Spectra;
- Drift Rate;
- Electron Emission;
- Space Charge;
- Electronics and Electrical Engineering