Roughening and Lower Critical Dimension in the Random-Field Ising Model
Abstract
It is argued on the basis of a new interface model that the lower critical dimension of random-field Ising systems is two, in agreement with simple domain estimates.
- Publication:
-
Physical Review Letters
- Pub Date:
- August 1982
- DOI:
- 10.1103/PhysRevLett.49.685
- Bibcode:
- 1982PhRvL..49..685G
- Keywords:
-
- 75.40.Dy;
- 05.50.+q;
- Lattice theory and statistics