Cavity Phase Shift Method For High Reflectance Measurements At Mid-Infrared Wavelengths
Abstract
The cavity phase shift method can measure high reflectances on spherical surfaces with good spatial resolution. Successful demonstration at 2.9 micrometers wavelength is described. A reflectance of 0.9920+/-0.0050 has been measured.
- Publication:
-
Optical Engineering
- Pub Date:
- December 1982
- DOI:
- 10.1117/12.7973018
- Bibcode:
- 1982OptEn..21..979K