Proton-induced single event upsets in NMOS microprocessors
Abstract
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1982
- DOI:
- 10.1109/TNS.1982.4336498
- Bibcode:
- 1982ITNS...29.2072S
- Keywords:
-
- Metal Oxide Semiconductors;
- Microprocessors;
- N-Type Semiconductors;
- Proton Impact;
- Radiation Effects;
- Single Event Upsets;
- Airborne/Spaceborne Computers;
- Circuit Reliability;
- Energetic Particles;
- Proton Energy;
- Proton Irradiation;
- Spacecraft Electronic Equipment;
- Electronics and Electrical Engineering