A portable system for upset and transient upset testing of VLSI circuits
Abstract
A portable system for testing VLSI circuits for both transient and permanent data upsets is described. The description includes both a general discussion of the system concept as well as the detailed design of a system capable of testing 64 data lines. A partially populated system using eight data lines has been built and used to verify system performance by testing a CMOS/SOS random access memory exposed to pulsed radiation from a linear accelerator. The test results on the memory are also discussed.
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1982
- DOI:
- 10.1109/TNS.1982.4336455
- Bibcode:
- 1982ITNS...29.1827M
- Keywords:
-
- Electronic Equipment Tests;
- Radiation Damage;
- Random Access Memory;
- Very Large Scale Integration;
- Errors;
- Pulsed Radiation;
- Electronics and Electrical Engineering