Geometrical considerations in the transient ionization testing of digital logic circuits
Abstract
Mechanisms are identified that can cause the transient response of digital logic circuits to depend on the logic state in which they are irradiated. Several of these mechanisms depend on surface topology, and for these cases the sensitive logic states can be determined by examining the topology. General approaches for transient radiation testing are also discussed for several MSI and LSI device technologies.
- Publication:
-
IEEE Transactions on Nuclear Science
- Pub Date:
- December 1982
- DOI:
- 10.1109/TNS.1982.4336453
- Bibcode:
- 1982ITNS...29.1816J
- Keywords:
-
- Electronic Equipment Tests;
- Ionizing Radiation;
- Logic Circuits;
- Radiation Effects;
- Topology;
- Transient Response;
- Large Scale Integration;
- Medium Scale Integration;
- Technology Assessment;
- Electronics and Electrical Engineering