Delay-line based techniques for microwave and millimeter-wave transmission/reflection test sets
Abstract
The present investigation provides a theoretical approach for the design of swept-frequency delay-line based measurement techniques in the microwave and millimeter-wave range. The development of equivalent transfer functions leads to simple but accurate mathematical expressions for devices under test (DUT) reflection/transmission parameters estimation. A computer simulation is carried out on a p-pole, Butterworth-type, model. The considered technique is found to be applicable for Q-factor measurements is Q is less than a certain maximum value. The maximum measurable Q-factor is proportional to the delay-line length and the frequency. It is pointed out, however, that the technique has not been implemented actually and, therefore, the practical usefulness of the suggested procedure remains to be proved.
- Publication:
-
IEEE Transactions on Microwave Theory Techniques
- Pub Date:
- August 1982
- DOI:
- 10.1109/TMTT.1982.1131218
- Bibcode:
- 1982ITMTT..30.1174B
- Keywords:
-
- Automatic Test Equipment;
- Delay Lines;
- Electronic Equipment Tests;
- Microwave Transmission;
- Millimeter Waves;
- Wave Reflection;
- Computerized Simulation;
- Network Analysis;
- Parameter Identification;
- Q Factors;
- Reflectometers;
- Transfer Functions;
- Electronics and Electrical Engineering