A simple model for short-channel effects of a buried-channel MOSFET on the buried insulator
Abstract
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- November 1982
- DOI:
- Bibcode:
- 1982ITED...29.1749O
- Keywords:
-
- Electrical Faults;
- Field Effect Transistors;
- Metal Oxide Semiconductors;
- Silicon Junctions;
- Volt-Ampere Characteristics;
- Carrier Transport (Solid State);
- Majority Carriers;
- Mathematical Models;
- Threshold Currents;
- Electronics and Electrical Engineering