Noise spikes in digital VLSI circuits
Abstract
An analysis is presented of the appearance of occasional noise spikes in very complex VLSI circuits. The noise spikes may cause so-called soft errors if the operating frequency is high and the variations in channel resistance large. The main contributing noise source is capacitive and inductive crosstalk. Noise spikes in present-day circuits are about an order of magnitude smaller than spikes caused by radioactive decay of trace elements in the encapsulation, and by cosmic rays. Fault-tolerant circuit design reducing the influence of radioactive and cosmic ray bombardment will help against noise spikes as well. A comparison is made with noise spikes in neurons.
- Publication:
-
IEEE Transactions on Electron Devices
- Pub Date:
- March 1982
- DOI:
- Bibcode:
- 1982ITED...29..451W
- Keywords:
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- Integrated Circuits;
- Large Scale Integration;
- Logic Circuits;
- Metal Oxide Semiconductors;
- Shot Noise;
- Thermal Noise;
- Bits;
- Capacitance;
- Crosstalk;
- Neurons;
- Numerical Analysis;
- Random Errors;
- Random Signals;
- Electronics and Electrical Engineering