Measuring the quantum correction at zero bias in metal-oxide-metal diode noise
Abstract
According to van der Ziel's (1980) interpretation of Tucker's (1979) calculation of the noise and admittance of metal-oxide-metal (MOM) diodes, these devices, when operating at high frequencies (100 GHz) and low temperatures (2 K), show a transition from quantum thermal noise at zero bias to shot noise at + or - 1 mV bias. By slowly modulating the bias of the MOM diode between -1 mV and +1 mV, mixing and amplifying the noise, passing it through a quadratic detector and then LF filtering the detected MOM noise power, it is possible to display the MOM diode noise power on a cathode ray oscillograph or strip-chart recorder as a function of bias, and thus calibrate the thermal noise at zero bias against the shot noise at higher bias.
- Publication:
-
IEEE Journal of Quantum Electronics
- Pub Date:
- January 1982
- DOI:
- 10.1109/JQE.1982.1071378
- Bibcode:
- 1982IJQE...18...17V
- Keywords:
-
- Background Noise;
- Mom (Semiconductors);
- Noise Spectra;
- Quantum Electrodynamics;
- Semiconductor Diodes;
- Tunnel Diodes;
- Bias;
- Correction;
- Electromagnetic Noise Measurement;
- Error Analysis;
- Metal Oxide Semiconductors;
- Shot Noise;
- Signal To Noise Ratios;
- Thermal Noise;
- Electronics and Electrical Engineering