Gate delays of InGaAs/InP heterojunction integrated injection logic

The delay time of an InGaAs/InP heterojunction bipolar transistor integrated injection logic gate is calculated as a function of the npn transistor upward current gain and for fan-outs of one and four. It is shown that intrinsic gate delays under 300 psec are possible with a fan-out of four for a gate designed with 3 micron design rules and having 0.5 micron npn and pnp base widths. Gate delays well under 100 psec are predicted for less conservative designs.