Dielectric constant of semi-insulating indium phosphide

An experimental investigation is conducted in order to determine the static dielectric constant of semi-insulating indium phosphide with accuracy sufficient for the design of monolithic millimeter-wave microstrip circuits. The measurement approach utilized the collection of a large number of data points at convenient frequencies from 4-18 GHz, each having better than 2% accuracy (most better than 0.5%), and then a statistical average value was determined, whose accuracy was much better than that of each individual data point. It is concluded that the static dielectric constant is within less than 0.5% of 12.55 for semi-insulating indium phosphide.