AlGaAs/GaAs JFETs by organometallic and molecular beam epitaxy
Abstract
Normally-off and normally-on AlGaAs/GaAs heterojunction gate GaAs FETs (HJFETs) for high-speed logic applications have been fabricated with molecular beam epitaxy (MBE) and organometallic vapor phase epitaxy (OM-VPE). The best normally-off devices used MBE n-GaAs active layers and OM-VPE gate layers of p(+)-AlGaAs and p(+)-GaAs. Saturation currents followed a square law and current scaling constants were the highest on record for HJFETs, greater than 50 microamps/micron-V-squared.
- Publication:
-
Electronics Letters
- Pub Date:
- February 1982
- DOI:
- 10.1049/el:19820075
- Bibcode:
- 1982ElL....18..112M
- Keywords:
-
- Gallium Arsenides;
- Heterojunction Devices;
- Jfet;
- Molecular Beam Epitaxy;
- Organometallic Compounds;
- Volt-Ampere Characteristics;
- Aluminum Gallium Arsenides;
- Saturation;
- Vapor Phase Epitaxy;
- Vhsic (Circuits);
- Electronics and Electrical Engineering