Electrooptical processor performance model
Abstract
Electrooptical techniques for compact, high-speed signal processing are a viable alternative to real-time electronic processing in many applications. An analytical model for a simple electrooptical processor (EOP) is described in terms of its error and noise source components, with attention given to the deleterious effects of CCDs which perform imaging and signal integration functions in the EOP device.
- Publication:
-
Applied Optics
- Pub Date:
- April 1982
- DOI:
- 10.1364/AO.21.001262
- Bibcode:
- 1982ApOpt..21.1262M
- Keywords:
-
- Electro-Optics;
- Instrument Errors;
- Optical Data Processing;
- Performance Prediction;
- Signal Processing;
- Charge Coupled Devices;
- Field Effect Transistors;
- Light Emitting Diodes;
- Masks;
- Noise Spectra;
- Real Time Operation;
- Signal To Noise Ratios;
- Transistor Amplifiers;
- Transmission Efficiency;
- Electronics and Electrical Engineering;
- SIGNAL PROCESSING;
- OPTICAL PROCESSING