Sputtering yields, positive secondary ion yields and relative degrees of ionization of sputtered atoms under bombardement of 10keV O 2+-ions have been determined for the single-phase binary alloy system Au/Pd. A weak minimum of the total sputtering yields was observed at a Pd-concentration around 75% atomic. Strong surface topography was found after high-dose ion bombardment. Sputtering yields, together with surface enrichment factors determined by Auger Electron Spectroscopy have been used to calculate surface binding energies for both alloy components. The apparent degree of ionization for positive ions shows a different behaviour for the two alloy components; whereas an almost constant value was found for Au, a distinct maximum at a Pd-concentration of about 40% was observed for Pd. The measurements indicate that, in the concentration range investigated, the concept of constant relative sensitivity factors would yield large analytical errors when applied to the quantization of secondary ion mass spectra of Au/Pd alloys.